LG Innotek has set a new benchmark in the industry with its groundbreaking AI-powered system for assessing raw materials, aimed at swiftly identifying defects right from receipt. Known for its innovation in technology, LG Innotek has unveiled an “Artificial Intelligence (AI)-based inspection system for incoming raw materials” that promises to revolutionize the detection process, catapulting them to the forefront of the industry by achieving what no other has before.
The fresh technology focuses on the Radio Frequency System-in-Package (RF-SiP) process and has recently been adapted for the highly valued Flip Chip Ball Grid Array (FC-BGA). This advancement is set to elevate the quality and competitiveness of LG Innotek’s semiconductor substrate products significantly. Traditionally, raw materials were subjected only to rudimentary visual inspections before being integrated into production. However, with the complexities of semiconductor substrates intensifying, so have the reliability challenges connected to the imperfections in incoming materials.
Core materials such as Prepreg (PPG), Ajinomoto Build-up Film (ABF), and Copper-Clad Laminate (CCL) have become crucial, as they arrive mixed with elements like glass fibers and inorganic components. In the past, inconsistencies like air voids or foreign particles were not of great concern. However, as the precision in specifications like circuit spacing became critical, these inconsistencies began to impact production integrity.
Imagine comparing this to a batch of cookie dough where pinpointing the concentration of ingredients or detecting air gaps with a simple glance is impossible. It highlights the inadequacy of conventional methods to locate material defects effectively—until now. Enter LG Innotek’s AI solution that combines material intelligence with advanced image processing, leading to a discovery process streamlined to just one minute. This analysis system not only provides a view of the defective areas but does so with an impressive accuracy level surpassing 90%.
One of the system’s main strengths lies in its ability to visualize, quantify, and standardize raw material quality, preventing substandard materials from slipping into the production line. By offering insightful data on quality deviations, LG Innotek can adjust material designs before they even enter the production phase, ensuring consistency and quality from the get-go.
A spokesperson for LG Innotek highlighted, “Our AI-powered inspection drastically cuts down the defect analysis time by an astounding 90%, while significantly reducing the associated costs.” With future plans to enhance the AI system through collaborative partnerships involving data sharing with customers and suppliers, the scope of this technology is set to expand further.
Looking beyond semiconductor substrates, LG Innotek plans to roll out this transformative approach to optical solutions, such as camera modules, where visual quality is pivotal. As emphasized by the company’s CTO, S. David Roh, the introduction of this technology marks the completion of LG Innotek’s unique AI ecosystem. This initiative embodies their commitment to advancing digital production technology, ensuring superior products are produced quickly and cost-effectively.
This innovative leap positions LG Innotek not just as a pioneer but as a leader determined to deliver nothing short of excellence in the production landscape.
